Special issue on electron and optical beam testing of integrated circuits - proceedings of the third European Conference on Electron and Optical Beam Testing of Integrated Circuits : September 9-11, 1991, Como, Italy
- Författare
- M. Melgara European Conference on Electron and Optical Beam Testing of Integrated Circuits 1991) Como :
- (Edited by M. Melgara ..)
- Genre
- Konferenser, Ej skönlitteratur, Konferenspublikation
- Språk
- Engelska
| Förlag | År | Ort | Om boken | ISBN |
|---|---|---|---|---|
| 1992 | Nederländerna | 534 sidor. |